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Arbiol Cobos, Jordi
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ICREA Research Professor at CSIC - ICMAB (Institut de Ciència de Materials de Barcelona). Technology & Engineering
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Jordi Arbiol graduated in Physics at the Universitat de Barcelona (UB), where he also obtained his Ph.D. (European Doctorate and PhD Extraordinary Award) in 2001 in the field of transmission electron microscopy (TEM) applied to nanostructured materials. He also worked at the microscopy facilities and as Assistant Professor at UB, focussing in TEM advanced techniques, such as HAADF electron tomography, HREELS and in general high resolution (S)TEM. In recent years, he has mainly focused his research on the structural characterization of nanomaterials, with special emphasis on 1D nanostructures such as semiconductor nanowires. He is currently ICREA Research Professor at Institut de Ciència de Materials de Barcelona, CSIC, is the group leader of the Group of Advanced Electron Nanoscopy, member of the Superconducting Materials Department, responsible at ICMAB and at FUSIO project (CSIC-UAB) of the Electron Microscopy area and member of the Executive Board of the Spanish Microscopy Society.
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Research Interests
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My research interest focuses on the structural, chemical and morphological properties of nanostructured materials: semiconductors, metals, metal oxides and functionalized materials for physical, chemical and bio-medical applications.
The increasing interest in Materials Nanoscience and Nanotechnology has created a serious global need for the development of nanoscopy tools in order to be able to observe and chemically analyze the synthesized nanostructures at the atomic scale. In this way, I have centered my research on the application and development of nanoscopy tools related to the electron microscopy and spectroscopies in order to solve the technological questions that nanotechnology asks for.
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KeyWords
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Materials Science, Transmission Electron Microscopy, Nanoscopy, Nanotechnology, Electron Spectroscopy
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